X-ray powder diffractometer with optics for nanolayers and nanosurfaces (UJEP33)

X-ray powder diffractometer with optics for nanolayers and nanosurfaces Panalytical X Pert PRO. X-ray diffractometer equipped with optics for structure analysis of polycrystalline thin films and nanosurfaces.

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Jan Evangelista Purkyně University in Ústí nad Labem

Čapková Pavla

+420475283188

pavla.capkova@ujep.cz

Pasteurova , 3544/1 , Ústí nad Labem , 400 96

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