X-ray photoelectron spectroscopy - XPS (Pro-NanoEnviCz III) (UJEP42)

X-Ray Photoelectron Spectroscopy (XPS) is a highly precise, non-destructive analytical technique used to determine the elemental composition and chemical state of surfaces. By measuring the kinetic energy of photoelectrons emitted from a material upon X-ray irradiation, XPS provides valuable insight into the first few nanometers of a sample, making it ideal for surface chemistry studies. This technique enables the identification of elements, their oxidation states, and chemical environments, offering essential data for material science, thin-film characterization, corrosion studies, and nanotechnology applications. The related methods Ion Scattering Spectroscopy (ISS) and Reflected Electron Energy Loss Spectroscopy (REELS) are in-situ available.

Aply for this equipment

Range of Expertise

WP3

WP4

WP5

WP6

WP7

WP8

Availability

Jan Evangelista Purkyně University in Ústí nad Labem

Kormunda Martin

+420 475 286 624

martin.kormunda@ujep.cz

Pasteurova , 3544/1 , Ústí nad Labem , 400 96

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