Jan Evangelista Purkyně University in Ústí nad Labem
Kormunda Martin
+420 475 286 624
martin.kormunda@ujep.cz
Pasteurova , 3544/1 , Ústí nad Labem , 400 96
X-Ray Photoelectron Spectroscopy (XPS) is a highly precise, non-destructive analytical technique used to determine the elemental composition and chemical state of surfaces. By measuring the kinetic energy of photoelectrons emitted from a material upon X-ray irradiation, XPS provides valuable insight into the first few nanometers of a sample, making it ideal for surface chemistry studies. This technique enables the identification of elements, their oxidation states, and chemical environments, offering essential data for material science, thin-film characterization, corrosion studies, and nanotechnology applications. The related methods Ion Scattering Spectroscopy (ISS) and Reflected Electron Energy Loss Spectroscopy (REELS) are in-situ available.
Kormunda Martin
+420 475 286 624
martin.kormunda@ujep.cz
Pasteurova , 3544/1 , Ústí nad Labem , 400 96