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X-Ray Photoelectron Spectroscopy - XPS (UPOL3) - UPGRADE (Pro-NanoEnviCzIII)

X-Ray Photoelectron Spectroscopy (XPS) is a highly precise, non-destructive analytical technique used to determine the elemental composition and chemical state of surfaces. By measuring the kinetic energy of photoelectrons emitted from a material upon X-ray irradiation, XPS provides valuable insight into the first few nanometers of a sample, making it ideal for surface chemistry studies. This technique enables the identification of elements, their oxidation states, and chemical environments, offering essential data for material science, thin-film characterization, corrosion studies, and nanotechnology applications. XPS is newly equipped with UPS and Raman Spectroscopy moduls. Ultraviolet Photoelectron Spectroscopy (UPS) is an advanced non-destructive technique for investigating the electronic structure of surfaces, often referred to as valence band spectroscopy. It utilizes ultraviolet photons to eject electrons from the material, enabling the precise determination of electron binding energies and work functions critical for surface and interface analysis. Raman Spectroscopy is an advanced non-destructive optical method for examining the vibrational modes of materials. By analyzing the inelastic scattering of monochromatic light, it provides a unique molecular fingerprint that reveals detailed information about chemical bonds, crystallinity, and structural properties.

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Palacký University Olomouc

Martin Petr

+420585634485

martin.petr@upol.cz

17. listopadu , 1192/12, Olomouc , 779 00

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