Scanning Probe Microscope (UPOL6)

Scanning Probe Microscope (SPM) NTEGRA NT-MDT Measuring in different modes: o Atomic force microscopy (AFM) o Magnetic force microscopy (MFM) o Scanning tunneling microscopy (STM)

Aply for this equipment

Range of Expertise

Availability

Palacký University Olomouc

Čépe Klára, Ph.D.

+420 585631429

klara.cepe@upol.cz

17. listopadu , 1192/12, Olomouc , 779 00

Download technical details

Back to list