Scanning Electrone Microscope (UFCH37) (Pro-NanoEnviCzIII)

Scanning Electron Microscope Model JSM-IT800SHL with the technical specifications: - Accelerating voltages: 0.50 – 30 kV - Working distance: 1.0 – 44 mm - Magnification: x0.1 – x2.00M - SEI detector, BSE detector - Stage 5 axis – X, Y, Z – motorized - Airlock Chamber - SNS – Stage Navigation System - EDS kit SSD detector - Plasma Cleaner - HORIBA cathodoluminescence, Raman

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Heyrovsky Institute of Physical Chemistry of the CAS, v. v. i.

Kalbáč Martin

+420 26605 3804

martin.kalbac@jh-inst.cas.cz

Dolejškova , 2155/3, Praha 8, 182 23

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