Heyrovsky Institute of Physical Chemistry of the CAS, v. v. i.
Eliska Mikyskova
+420 26605 3039
eliska.mikyskova@jh-inst.cas.cz
Dolejškova , 2155/3, Praha 8, 182 23
Photoelectron spectrometer with Kelvin probe (UFCH36) (Pro-NanoEnviCzIII)
The ambient pressure photoelectron spectroscopy system (APS) offers energy level characterization of the absolute Work Function (Φ) for metals or Ionization Potential (IP) for semiconductors using a 3.3–7.0 eV tunable DUV optical source. The whole system uniquely offers the combination of (Φ, IP, Ef, Eg) measurements in one unit. The system includes a high-resolution Kelvin probe and darkened environment for determination of the sample Fermi-level (Ef) with respect to the gold alloy vibrating tip. The system allows characterisation of work function homogeneity of clean and coated surfaces on samples up to 50x50 mm2. For larger samples it offers scanning platform options up to 350x350 mm2. APS04 includes a variable intensity white light source for Surface Photovoltage (SPV) studies used to measure the intensity-dependent surface potential changes on semiconductors and VOC on planar solar cells. The APS04 configuration includes a second tunable Vis/IR source providing Surface Photovoltage Spectroscopy (SPS) over the energy range 1.2-3.1 eV (1000-400 nm) which can be used for both band-gap Eg and photo-excitation measurements.
Range of Expertise
