Institute of Inorganic Chemistry of the AS CR, v.v.i.
Ecorchard Petra
+420266172202
ecorchard@iic.cas.cz
Husinec-Řež , 1001 , Řež, 250 68
AFM (UACH1)
Atomic Force microscope provides imaging sample topography at high resolution, measuring magnetic structure of the sample surface by MFM and measuring electrical properties by STM.
Range of Expertise
WP3
- Conceptually new nanostructured materials with the potential for application in innovative technologies
- Computer aided nanomaterials design
- Low dimensional materials and their composites (carbon dots, nanotubes, graphene derivatives)
- Nanofibers
- Magnetic hybrids
- Metal and metal oxide NPs
- Redox active nanomaterials
- Nanomaterials for biomedical applications
WP4
WP6
WP7
