Heyrovsky Institute of Physical Chemistry of the CAS, v. v. i.
Kalbáč Martin
+420 26605 3804
martin.kalbac@jh-inst.cas.cz
Dolejškova , 2155/3, Praha 8, 182 23
Surface Characterization System (UFCH32)
Combined ultra-high vacuum apparatus for complex study of thin films, interfaces and surface nanostructures (SPECSR) encompassing: - X-ray photoelectron spectroscopy (XPS) with microfocused (200 m) monochromatic X-ray source (hʋ=1486.6 eV) - ultraviolet photoelectron spectroscopy with excitation of electrons by monochromatized He I (21.2 eV) and He II (40.8 eV) radiation - hemispherical electron energy analyzer with two-dimensional electron and ion detector and sample manipulator allowing measurement of high resolution spectra from room temperature down to liquid Helium temperature at different polar and azimutal detection angles, band structure mapping by angle-resolved photoemission spectroscopy (ARPES) technique using scanning angle lens - low-energy electron diffraction (LEED) technique for the determination of the surface structure and accurate surface atomic positions of materials - ion gun for cleaning of surfaces - scanning probe microscopy (SPM) for investigations at atomic scale of a wide variety of materials
Range of Expertise
WP3
- Conceptually new nanostructured materials with the potential for application in innovative technologies
- Computer aided nanomaterials design
- Low dimensional materials and their composites (carbon dots, nanotubes, graphene derivatives)
- Nanofibers
- Magnetic hybrids
- Redox active nanomaterials
- Nanomaterials for biomedical applications
- Metal and metal oxide NPs
