XPS/ESCA and Auger electron spectroscopy (UJEP3) MODERNIZATION - Pro-NanoEnviCzII

The instrument is an electron spectrometer SPECS with an X-Ray source of achromatic (Al/Mg) and monochromatized (Al/Ag) photons for electron spectroscopy (XPS/ESCA) analyses with electron source-based charge compensation. The system also is equipped with an electron source (50 eV – 3000 eV) for Auger electron spectroscopy (AES) with scanning options and an SE detector (SEM/SAM). The detection unit is 5 channel channeltron. The base pressure is about 4x10-9 mbar. The solid samples and powder samples can be analyzed. The limitation is mainly in the sample stability under the measurement conditions. Heavily outgassing samples are not suitable. It is possible to detect the presence of surface contaminations or residua. The sample size is limited to a diameter of 20 mm and a height of 10 mm. A depth profiling of elemental composition is possible by Argon ions sputtering from an external ion source.

Aply for this equipment

Range of Expertise

WP3

WP4

WP5

WP6

WP7

WP8

Availability

Jan Evangelista Purkyně University in Ústí nad Labem

Kormunda Martin

+420 475 286 624

martin.kormunda@ujep.cz

Pasteurova , 3544/1 , Ústí nad Labem , 400 96

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