If you would like to learn more about a powerful characterization microscopic technique, join us on Wednesday, May 14th, 2025, at 2:30. p.m. Dr. Eirini Ioannou from the Palacký University in Olomouc, Czech Advanced Technology and Research Institute, will give her talk titled "A Closer Look: SEM Applications in Nanostructured Materials". Join Zoom Meeting https://cesnet.zoom.us/j/92586933435

A Closer Look: SEM Applications in Nanostructured Materials

Dr. Eirini Ioannou

Palacký University of Olomouc, Czech Advanced Technology and Research Institute, Regional Centre of Advanced Technologies and Materials, Křížkovského 511/8, 77900 Olomouc, Czech Republic

 Abstract:

 Scanning Electron Microscopy (SEM) is a powerful analytical technique widely used in nanomaterials science for its ability to provide high-resolution imaging and detailed surface characterization. By scanning a focused electron beam over a sample, SEM offers insights into morphology, topography, and composition with nanometer-scale precision. It is widely applied across diverse fields, including materials science, biology, electronics and nanotechnology. More specifically, in materials research, SEM is crucial for characterizing a broad range of materials such as nanocomposites, thin films, catalysts, semiconductors, polymers and metals. The versatility of SEM, enhanced by features such as Energy Dispersive X-ray Spectroscopy (EDS) for elemental analysis, makes it an essential tool for research and quality control in both academic and industrial settings.

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Meeting ID: 925 8693 3435

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